Our Products
QM1000™ Quad-Site Tester
USEA recently introduced the QM1000™ quad-site instrument for testing analog and mixed signal semiconductor devices. This low cost, high throughput service and product is ideal for specialty testing of MOSFETs, JFETs, IGBTs, diodes, mixed signal ICs, and discrete analog devices.
Designed to mate with and expand the capabilities of the LTX-Credence ASL1000, the QM1000™ performs both DC and specialty AC tests, including QG, RG, CG, and UIL/UIS (Avalanche). The ability to perform quad-site testing on a single insertion basis reduces device handling requirements and eliminates the need for multiple external instruments to fully characterize semiconductor devices. The QM1000™ offers up to 4X improvement in test throughput and yield, and is compatible with film frame, rotary, and auto handlers.
In addition to direct sales of the QM1000™, USEA offers test services located at Cabuyao City, Laguna, Philippines. Customers have the option of purchasing time and using the QM1000™ on their own or utilizing USEA’s seasoned team of test engineers to perform semiconductor testing on a contract basis.
ASL1000 Power Supply Checker
Features
- Can measure and display data of actual DC voltages (±5V, +12V, ±16VDC, ±24VDC, ±50VDC, ±65VDC) and AC ripple source per supply modules of ASL1000 Test System.
- Low cost / Simple Hardware.
- Test Program Software is included in the package.
Advantages
- Easy to use in determining which Power Supply module/s failing.
- Reduce downtime when troubleshooting.
- Increase the efficiency of the Test System.
DataCruncher™
The DataCruncher™ is a comprehensive suite of device and wafer data acquisition tools designed for engineers and in-house manufacturing teams. As a web-based platform, it provides easy access to production and engineering data, from wafer sorting to final testing. The tool facilitates the creation of detailed histograms and other visual reports, helping you and your customers monitor and enhance overall device performance.
Test Data Analysis
DataCruncher™ features the most commonly used statistical calculations (Average, Standard Deviation and CPK) and presented in a report for easy analysis. Statistical Data from more than one lot can be shown side by side for easy comparison.
Test Data Analysis
Histogram of test parameters can be produced to show trends in parametric test results. Data from more than one lots can be combined and analyzed in one chart.
Wafer Map and Die Info
Shows a graphical map of binning test results, color coded with the bin number indicated for easy identification. Clicking on a die will show XY coordinates and bin value.
Stacked Wafer maps
Applicable to wafer probe data for showing a graphical map of binning results for a number of wafers. Tally of failed bins per wafer die position is displayed on screen.
High Voltage (HV) Box
HV Box is a test solution developed for high-voltage devices of up to 1500VDC. It is designed to enhance the capability of the LTX-Credence ASL1000 to a much higher DC voltage and the ability to test AC and Static electrical characteristics of power electronic devices.
The components of our HV Box has:
- Pin Protection
- Multiplexers
- Timing Interface
- Floating Voltmeter
- Floating I/V Converter
- Auxiliary Drivers
- Relay Drivers
- High Voltage Source with Measurement
- Short-Circuit Current Test
- Digital Driver & Detector Buffers
- Timing Interface
